BS EN IEC 61643-331:2020
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Components for low-voltage surge protection – Performance requirements and test methods for metal oxide varistors (MOV)
Published By | Publication Date | Number of Pages |
BSI | 2020 | 48 |
IEC 61643-331:2020 is available as IEC 61643-331:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61643-331:2020 is a test specification for metal oxide varistors (MOV), which are used for applications up to 1 000 V AC or 1 500 V DC in power lines, or telecommunication, or signalling circuits. They are designed to protect apparatus or personnel, or both, from high transient voltages. This document applies to MOVs having two electrodes and hybrid surge protection components. This document also does not apply to mountings and their effect on the MOV’s characteristics. Characteristics given apply solely to the MOV mounted only in the ways described for the tests. This third edition cancels and replaces the second edition published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: – a Varistor MCOV rating assurance test; – an energy rating test (2ms); – revised Dielectric strength and insulation resistance tests.
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
5 | Annex ZA(normative)Normative references to international publicationswith their corresponding European publications |
7 | CONTENTS |
10 | FOREWORD |
12 | 1 Scope 2 Normative references |
13 | 3 Terms, definitions, symbols and abbreviated terms 3.1 Terms and definitions 3.1.1 Ratings |
14 | 3.1.2 Characteristics |
15 | Figure 1 – V-I characteristic of an MOV |
16 | 3.2 Symbols and abbreviated terms used in this document 3.2.1 Symbols 3.2.2 Abbreviated terms Figures Figure 2 – Symbol for MOV Figure 3 – Symbol for thermally protected MOV |
17 | 4 Service conditions 4.1 Operating and storage temperature ranges 4.2 Altitude or atmospheric pressure range 4.3 Relative Humidity 5 Mechanical requirements and materials 5.1 Robustness of terminations 5.2 Solderability 5.3 Marking |
18 | 6 General 6.1 Failure rates 6.2 Test standard atmospheric conditions 7 Electrical requirements 7.1 Varistor voltage (VV) 7.2 Maximum AC (DC) continuous voltage (VM(AC) / VM(DC)) 7.3 Standby current (ID) 7.4 Capacitance (CV) 7.5 Clamping voltage (VC) |
19 | Tables Table 1 – Typical Voltage ratings for disc types |
20 | 7.6 Electrostatic discharge (ESD) (for SMD type MOV only) 7.7 Rated impulse energy 7.8 Nominal discharge current (In) 7.9 Endurance 7.10 Limited current temporary overvoltage Table 2 – Typical Voltage Ratings for SMD types |
21 | 8 Standard design test criteria 8.1 General 8.2 Ratings 8.2.1 Single-impulse maximum current (ITM) 8.2.2 Next impulse Figure 4 – Test circuit for single-impulse maximum current |
22 | 8.2.3 Maximum Continuous voltage (VM) 8.3 Electrical Characteristics 8.3.1 Clamping voltage (VC) 8.3.2 Standby current (ID) 8.3.3 Varistor voltage (VV) Figure 5 – Test circuit for measuring standby current |
23 | 8.3.4 Capacitance (CV) 8.3.5 Rated energy 8.4 Varistor Rating Assurance Testing Figure 6 – Test circuit for measuring varistor voltage (VV) |
24 | 8.5 ESD test 9 Nominal discharge current and limited current temporary overvoltage 9.1 Thermally protected varistors – Sequence of tests 9.2 Temperature and humidity cycle conditioning Figure 7 – Varistor rating assurance test setup |
25 | 9.3 Nominal discharge current (In) test description 9.3.1 General |
26 | Figure 8 – Nominal discharge current test flowchart |
27 | 9.3.2 Pass/fail criteria 9.4 Limited current temporary overvoltage test description and procedure for thermally protected varistors 9.4.1 General Figure 9 – Sequence of the In Test |
28 | 9.4.2 Sample preparation 9.4.3 Test conditions 9.4.4 Pass/fail criteria |
29 | 9.5 Dielectric testing 9.5.1 Test conditions for thermally protected MOV Figure 10 – Temporary overvoltage limited current test procedure flowchart |
30 | 9.5.2 Setup from foil to leads 9.5.3 Pass criteria 9.6 Insulation Resistance Table 3 – Test voltages for dielectric strength Between Test voltage |
31 | Annexes Annex A (informative) MOV testing according to the IEC 61643-11:2011 Surge protective devices for the Class I, II and III A.1 General A.2 MOV selection A.3 Cross reference list of abbreviations, descriptions and definitions |
32 | A.4 Operating duty test A.4.1 General Table A.1 – Abbreviations, descriptions and definitions |
33 | Figure A.1 – Flow chart of the operating duty test |
34 | Figure A.2 – Test set-up for operating duty test |
36 | Figure A.3 – Flow chart of testing to determine the measured limiting voltage |
37 | A.4.2 Class I and II operating duty tests (8.3.4.3) Figure A.4 – Operating duty test timing diagram for test classes I and II |
38 | A.4.3 Additional duty test for test class I A.4.4 Class III operating duty tests Figure A.5 – Additional duty test timing diagram for test class I |
39 | A.4.5 Pass criteria for all operating duty tests and for the additional duty test for test class I A.4.6 Preferred parameters of impulse discharge current Iimp used for Class I additional duty tests Figure A.6 – Operating duty test timing diagram for test class III Table A.2 – Preferred parameters for class I test |
40 | A.4.7 Preferred values of impulse discharge current In used for Class I and Class II residual voltage and operating duty tests A.4.8 Preferred values of combination generator waveshape used for Class III tests Table A.3 – Preferred values for class I and class II tests |
41 | Table A.4 – Preferred values for class III tests |
43 | Annex B (informative) IEC 61051 Varistors for use in electronic equipment |
44 | Annex C (normative) Accelerated Endurance screening test C.1 Accelerated endurance screening test C.2 Preparation of sample C.3 Test conditions C.4 Refer to test circuit diagram as shown in Figure C.1. Figure C.1 – Circuit of accelerated ageing test Table C.1 – Current in VT measurement |
45 | C.5 Pass criteria |
46 | Annex D (informative) Proposed test method of MTTF – Mean time to failure (MTTF) D.1 Sampling plans D.2 Total test hours D.3 Samples Table D.1 – Sampling plans |
47 | D.4 Test set-up D.5 Intermediate measurements D.6 Failure criteria D.7 Acceptance criteria Figure D.1 – Test Circuit of MTTF |