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BS ISO 22493:2014

BS ISO 22493:2014

$142.49

Microbeam analysis. Scanning electron microscopy. Vocabulary

Published By Publication Date Number of Pages
BSI 2014 32
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This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

This International Standard is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of this International Standard are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

PDF Catalog

PDF Pages PDF Title
6 Foreword
7 Introduction
9 Section sec_1
Section sec_2
Section sec_3
Section sec_3.1
Section sec_3.1.1
Section sec_3.1.1.1
1 Scope
2 Abbreviated terms
3 Terms and definitions used in the physical basis of SEM
10 Section sec_3.1.1.2
Section sec_3.1.2
Section sec_3.1.2.1
Section sec_3.1.2.1.1
Section sec_3.1.2.1.2
Section sec_3.1.2.2
Section sec_3.1.3
Section sec_3.1.3.1
Section sec_3.1.3.2
Section sec_3.1.4
Section sec_3.1.5
Section sec_3.2
Section sec_3.2.1
11 Section sec_3.2.1.1
Section sec_3.2.2
Section sec_3.2.3
Section sec_3.2.4
Section sec_3.2.5
Section sec_3.3
Section sec_3.3.1
Section sec_3.3.2
Section sec_3.3.3
Section sec_3.3.4
12 Section sec_3.3.5
Section sec_3.3.6
Section sec_3.3.7
Section sec_3.3.8
Section sec_3.4
Section sec_3.4.1
Section sec_3.4.2
Section sec_3.4.3
Section sec_3.4.4
Section sec_3.4.5
Section sec_3.4.6
Section sec_3.4.7
Section sec_3.4.8
13 Section sec_3.4.9
Section sec_3.5
Section sec_3.5.1
Section sec_3.5.2
Section sec_3.5.3
Section sec_3.5.4
Section sec_3.5.5
Section sec_3.6
Section sec_3.7
Section sec_3.7.1
Section sec_4
Section sec_4.1
Section sec_4.1.1
4 Terms and definitions used in SEM instrumentation
14 Section sec_4.1.1.1
Section sec_4.1.1.1.1
Section sec_4.1.1.1.2
Section sec_4.1.1.2
Section sec_4.1.2
Section sec_4.1.2.1
Section sec_4.1.2.2
Section sec_4.1.2.3
Section sec_4.1.2.4
Section sec_4.1.2.5
Section sec_4.1.3
15 Section sec_4.1.4
Section sec_4.1.5
Section sec_4.1.6
Section sec_4.2
Section sec_4.2.1
Section sec_4.2.1.1
Section sec_4.2.1.2
Section sec_4.2.2
Section sec_4.2.2.1
Section sec_4.2.2.2
Section sec_4.2.2.3
16 Section sec_4.2.2.4
Section sec_4.2.3
Section sec_4.2.3.1
Section sec_4.2.4
Section sec_4.2.5
Section sec_4.2.5.1
Section sec_4.2.5.2
Section sec_4.2.5.3
Section sec_4.3
Section sec_4.3.1
Section sec_4.3.2
17 Section sec_4.3.3
Section sec_4.3.4
Section sec_4.4
Section sec_4.4.1
Section sec_4.4.2
Section sec_4.4.3
Section sec_4.4.4
Section sec_4.4.5
Section sec_4.5
Section sec_4.5.1
18 Section sec_4.5.2
Section sec_4.5.3
Section sec_4.5.4
Section sec_4.5.5
Section sec_4.6
Section sec_4.6.1
Section sec_4.6.2
Section sec_4.6.2.1
Section sec_4.6.2.2
Section sec_4.6.2.3
Section sec_4.6.2.4
Section sec_4.6.2.5
19 Section sec_4.6.2.6
Section sec_4.6.2.7
Section sec_4.6.2.8
Section sec_4.6.2.9
Section sec_4.6.2.10
Section sec_4.6.3
Section sec_4.7
Section sec_4.7.1
Section sec_4.7.2
Section sec_4.7.3
20 Section sec_5
Section sec_5.1
Section sec_5.1.1
Section sec_5.1.2
Section sec_5.1.2.1
Section sec_5.1.3
Section sec_5.1.3.1
Section sec_5.2
Section sec_5.2.1
Section sec_5.2.2
Section sec_5.2.2.1
Section sec_5.2.2.2
5 Terms and definitions used in SEM image formation and processing
21 Section sec_5.2.2.2.1
Section sec_5.2.3
Section sec_5.2.4
Section sec_5.2.5
Section sec_5.3
Section sec_5.3.1
Section sec_5.3.2
Section sec_5.3.3
22 Section sec_5.3.3.1
Section sec_5.3.3.2
Section sec_5.3.3.3
Section sec_5.3.4
Section sec_5.3.5
Section sec_5.3.5.1
Section sec_5.3.5.2
Section sec_5.3.6
Section sec_5.3.7
Section sec_5.3.8
Section sec_5.3.9
23 Section sec_5.3.9.1
Section sec_5.3.10
Section sec_5.3.11
Section sec_5.4
Section sec_5.4.1
Section sec_5.4.1.1
Section sec_5.4.1.2
Section sec_5.5
Section sec_5.6
Section sec_5.6.1
Section sec_5.6.2
Section sec_5.6.3
24 Section sec_5.6.4
Section sec_6
Section sec_6.1
Section sec_6.2
Section sec_6.2.1
Section sec_6.2.2
Section sec_6.2.3
Section sec_6.2.4
Section sec_6.3
6 Terms and definitions used in SEM image interpretation and analysis
25 Section sec_6.4
Section sec_6.5
Section sec_6.5.1
Section sec_6.6
Section sec_6.6.1
Section sec_6.6.2
Section sec_6.6.3
Section sec_6.6.4
Section sec_6.6.5
Section sec_6.6.6
Section sec_6.6.7
Section sec_6.6.8
Section sec_6.6.9
26 Section sec_6.6.10
Section sec_7
Section sec_7.1
Section sec_7.1.1
Section sec_7.1.2
Section sec_7.1.3
Section sec_7.1.4
Section sec_7.2
Section sec_7.2.1
Section sec_7.2.2
Section sec_7.2.3
Section sec_7.2.4
7 Terms and definitions used in the measurement and calibration of SEM image magnification and resolution
27 Section sec_7.3
Section sec_7.3.1
Section sec_7.3.2
Section sec_7.4
28 Reference ref_1
Reference ref_2
Reference ref_3
Reference ref_4
Reference ref_5
Bibliography
BS ISO 22493:2014
$142.49