BS QC 750114:1996
$102.76
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
| Published By | Publication Date | Number of Pages |
| BSI | 1996 | 20 |
| Status | Definitive |
|---|---|
| Pages | 20 |
| Publication Date | 1996-12-15 |
| ISBN | 0 580 26500 5 |
| Standard Number | BS QC 750114:1996, IEC 60747-8-3:1995 |
| Title | Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
| Identical National Standard Of | QC 750114, IEC 60747-8-3:1995 |
| Descriptors | Inspection, Detail specification, Qualification approval, Approval testing, Specification (approval), Field-effect transistors, Semiconductor devices, Transistors, Electronic equipment and components, Quality assurance systems, Assessed quality, Testing conditions |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.30 - Transistors |
