BSI 18/30381548 DC:2018 Edition
$13.70
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) – Part 1. Fast BTI Test method
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 17 |
| Status | Definitive |
|---|---|
| Pages | 17 |
| Publication Date | 2018-08-03 |
| Standard Number | 18/30381548 DC |
| Title | BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) – Part 1. Fast BTI Test method |
| Identical National Standard Of | IEC 62373-1 Ed.1.0 |
| Descriptors | Testing conditions, Semiconductors, Voltage measurement, Electronic equipment and components, Temperature, Transistors, Metal oxide semiconductors, Semiconductor devices |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.30 - Transistors |
