BSI PD IEC TR 63170:2018
$215.11
Measurement procedure for the evaluation of power density related to human exposure to radio frequency fields from wireless communication devices operating between 6 GHz and 100 GHz
| Published By | Publication Date | Number of Pages |
| BSI | 2018 | 102 |
This document describes the state of the art measurement techniques and test approaches for evaluating the local and spatial-average incident power density of wireless devices operating in close proximity to the users between 6 GHz and 100 GHz.
In particular, this document provides guidance for testing portable devices in applicable operating position(s) near the human body, such as mobile phones, tablets, wearable devices, etc. The methods described in this document may also apply to exposures in close proximity to base stations.
This document also gives guidance on how to assess exposure from multiple simultaneous transmitters operating below and above 6 GHz (including combined exposure of SAR and power density).
NOTE Compliance of devices with sufficiently low radiated power that is incapable of exceeding basic restrictions is addressed by IEC 62479 [2] and therefore not described in this document.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 4 | CONTENTS |
| 10 | FOREWORD |
| 12 | INTRODUCTION |
| 13 | 1 Scope 2 Normative references 3 Terms and definitions |
| 17 | 4 Symbols and abbreviated terms 4.1 Symbols 4.1.1 Physical quantities 4.1.2 Constants |
| 18 | 4.2 Abbreviated terms 5 Description of the measurement system 5.1 General 5.2 Scanning system |
| 19 | 5.3 Device holder 5.4 Reconstruction algorithms 6 Power density assessment 6.1 General Figures Figure 1 – Simplified view of a generic measurement setup involvingthe use of reconstruction algorithms |
| 20 | Figure 2 – Evaluation process overview |
| 21 | 6.2 Measurement preparation 6.2.1 System check Figure 3 – Overview of power density measurement methods |
| 22 | 6.2.2 Preparation of the device under test 6.2.3 Operating modes 6.2.4 Test frequencies for DUT |
| 23 | 6.2.5 Evaluation surface and DUT test position |
| 24 | Figure 4 – Illustration of evaluation surface (in black) Figure 5 – Illustration of evaluation surface correspondingto the flat phantom surface shape |
| 25 | 6.3 Tests to be performed 6.4 General measurement procedure 6.4.1 General Figure 6 – Illustration of evaluation surface corresponding tothe maximum available local or spatial-average power density |
| 26 | 6.4.2 Power density assessment based on E- and H-field |
| 27 | 6.4.3 Power density measurement based on the evaluation of E-field or H-field amplitude only |
| 28 | 6.5 Measurements of devices with multiple antennas or multiple transmitters 6.5.1 General Tables Table 1 – Minimum separation distance between the DUT’s antennaand the evaluation surface for which Formula (3) applies |
| 29 | Figure 7 – SAR and power density evaluation at a point r |
| 30 | 6.5.2 Examples |
| 32 | 7 Uncertainty estimation 7.1 General considerations 7.2 Uncertainty model 7.3 Uncertainty components dependent on the measurement system 7.3.1 Calibration of the measurement equipment 7.3.2 Probe correction |
| 33 | 7.3.3 Isotropy 7.3.4 Multiple reflections 7.3.5 System linearity 7.3.6 Probe positioning 7.3.7 Sensor location 7.3.8 Amplitude and phase drift 7.3.9 Amplitude and phase noise |
| 34 | 7.3.10 Data point spacing 7.3.11 Measurement area truncation 7.3.12 Reconstruction algorithms 7.4 Uncertainty terms dependent on the DUT and environmental factors 7.4.1 Probe coupling with DUT 7.4.2 Modulation response 7.4.3 Integration time 7.4.4 DUT alignment |
| 35 | 7.4.5 RF ambient conditions 7.4.6 Measurement system immunity/secondary reception 7.4.7 Drift of DUT 7.5 Combined and expanded uncertainty |
| 36 | Table 2 – Example of measurement uncertainty evaluationtemplate for power density measurements |
| 37 | 8 Measurement report 8.1 General 8.1.1 General 8.1.2 Items to be recorded in the measurement report |
| 38 | 9 Recommendation for future work 9.1 Measurement standard for EMF compliance assessment of devices operating at frequencies above 6 GHz 9.1.1 General |
| 39 | 9.1.2 Test frequencies 9.1.3 Evaluation surfaces |
| 40 | 9.1.4 Evaluation of exposure from multiple transmitters 9.1.5 Other future work items |
| 41 | 9.2 Numerical standard for EMF compliance assessment of devices operating at frequencies above 6 GHz 9.3 Updates to IEC 62232 |
| 42 | Annex A (informative)Measurement system check and validation A.1 Background A.1.1 General A.1.2 Objectives of system check A.1.3 Objectives of system validation |
| 43 | A.2 Measurement setup and procedure for system check and system validation A.2.1 General A.2.2 Power measurement setups Figure A.1 – A recommended power measurement setup for system checkand system validation |
| 44 | A.2.3 Procedure to normalize the measured power density A.3 System check A.3.1 System check sources and test conditions A.3.2 Test procedure A.4 System validation A.4.1 Reference sources and test conditions |
| 45 | A.4.2 System validation procedure |
| 46 | Annex B (informative)Examples of reference sources B.1 Background B.2 Cavity-fed dipole arrays B.2.1 Description |
| 47 | Figure B.1 – Main dimensions for the cavity-backed array of dipoles |
| 48 | Table B.1 – Main dimensions for the cavity-backed dipole arrayat each frequency of interest |
| 49 | B.2.2 Target values Table B.2 – Target values for the cavity-backed dipole arraysat different frequencies (us (k = 1) = 0,5 dB) |
| 50 | Figure B.2 – 10 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate |
| 51 | Figure B.3 – 30 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate |
| 52 | Figure B.4 – 60 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate |
| 53 | Figure B.5 – 90 GHz patterns for the |Etotal| and Re{S}total for the cavity-backed array of dipoles at various distances, d, from the upper surface of the dielectric substrate |
| 54 | B.3 Pyramidal horns loaded with a slot array B.3.1 Description Figure B.6 – Main dimensions for the 0,15 mm stainless steel stencil with slot array Figure B.7 – Main dimensions for the pyramidal horn antennas |
| 55 | B.3.2 Target values Table B.3 – Main dimensions for the stencil with slot array for each frequency Table B.4 – Main dimensions for the corresponding pyramidal horn at each frequency |
| 56 | Table B.5 – Target values for the pyramidal horns loaded with slot arrays at different frequencies (us (k = 1) = 0,5 dB) |
| 57 | Figure B.8 – 10 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the array surface and Pin = 0 dBm |
| 58 | Figure B.9 – 30 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the array surface and Pin = 0 dBm |
| 59 | Figure B.10 – 60 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the upper surfaceof the slot array |
| 60 | Figure B.11 – 90 GHz patterns for the |Etotal| and Re{S}total for the pyramidal horn loaded with an array of slots at various distances, d, from the upper surfaceof the slot array |
| 61 | Annex C (informative)Examples of system check sources C.1 Background C.2 Source description C.3 Target values Table C.1 – Target values for pyramidal horn antennas at different frequencies |
| 62 | Annex D (informative)Information on the applicability of far-field methods D.1 Background D.2 Evaluation method using EIRP D.2.1 General D.2.2 Numerical simulated results |
| 63 | Figure D.1 – Antenna models at 28,5 GHz |
| 64 | Figure D.2 – Seirp compared to Sav (normalized to maximum of Seirp) |
| 65 | D.3 Plane wave equivalent approximation D.3.1 General D.3.2 Numerical simulated results |
| 66 | Figure D.3 – Plane wave equivalent approximation (Se) and simulation (Sav) results |
| 67 | Figure D.4 – Difference of Se to Sav for all antennas (%) |
| 68 | Annex E (informative)Rationale for the use of square or circular shapes for the averaging area applied to the power density for compliance evaluation E.1 General E.2 Method using computational analysis E.3 Areas averaged with square and circular shapes Figure E.1 – Schematic view of the assessment of the variationof Sav using square shape by rotating AUT |
| 69 | Figure E.2 – Comparison of maximum valuesof Sav averaged toward square and circular shapes |
| 70 | Annex F (informative)Near field reconstruction algorithms F.1 General |
| 71 | F.2 Field expansion methods F.2.1 General F.2.2 The plane wave spectrum expansion |
| 72 | Figure F.1 – Comparison of maximum values of Sav betweenthe computational simulation and back projection at 30 GHz |
| 73 | F.3 Inverse source methods Figure F.2 – Comparison of maximum values of Sav betweenthe computational simulation and back projection at 60 GHz |
| 74 | F.4 Implementation scenarios F.4.1 General F.4.2 Alternative field measurements F.4.3 Phase-less approaches F.4.4 Direct or quasi-direct near field measurements |
| 75 | Annex G (informative)Example of a mixed (numerical and experimental) approachto assess EMF compliance for a WiGig device G.1 General G.2 Approach used to assess conformance |
| 76 | Figure G.1 – Evaluation plane and antenna position |
| 77 | Figure G.2 – Local and spatial-average power densities in mW/cm2 Table G.1 – Phase shifts between antenna elements leadingto the maximum power density for each channel |
| 78 | G.3 Conclusion Figure G.3 – Spatial-average power densities variationwith the distance from evaluation plane Figure G.4 – Correlation (simulation vs. measurement) |
| 79 | Annex H (informative)Use cases H.1 General Figure H.1 – Picture of the mock-up used for power density measurements |
| 80 | H.2 Configurations Figure H.2 – Antenna geometry Figure H.3 – Picture of the mock-up numerical model |
| 81 | H.3 Results obtained at Laboratory 1 H.3.1 General H.3.2 Miniaturized probe H.3.3 Scans Table H.1 – Phase shift values for the mockup antenna ports. |
| 82 | Figure H.4 – Illustration of the angles used for the numerical descriptionof the sensor and the orientation of an ellipse in 3-D space |
| 83 | H.3.4 Total field and power density reconstruction H.3.5 Power density averaging Figure H.5 – Numerical algorithm for reconstructing the ellipse parameters |
| 84 | H.3.6 Measuring setup Figure H.6 – Measuring setup used at Laboratory 1 Table H.2 – Measured power at the end of the adapter 2,4 mm to 3,5 mm and input power at the antenna port after considering extra losses introduced by thesemi-rigid 200 mm coaxial cable and connectors |
| 85 | H.3.7 Simulated results H.3.8 Measured results Figure H.7 – DUT while measuring showing the numbering for the ports |
| 86 | Table H.3 – Edge length of the scanned planes for the different configurations |
| 87 | Figure H.8 – Simulated (left) and measured (right) power density distributionfor the TOP configuration |
| 88 | Figure H.9 – Simulated (left) and measured (right) power density distributionfor the FRONT configuration |
| 89 | Figure H.10 – Averaged power density as a function of distance for port 1, at 27,925 GHz, for TOP and FRONT configurations averaged over an area of 4 cm2 |
| 90 | Figure H.11 – Averaged power density as a function of averaging area for port 1at different frequencies |
| 91 | H.4 Results obtained at Laboratory 2 H.4.1 General H.4.2 Measurement setup Figure H.12 – Distribution of the power density corresponding to the arraywith zero phase-shift between elements (configuration w1 of Table H.1) |
| 92 | H.4.3 Data processing H.4.4 Numerical simulations and comparison with measurements Figure H.13 –Mock-up with antenna port number 2 connected to the VNA (left)and the open waveguide probe and alignment system (right) |
| 94 | Figure H.14 – Simulated (left) and measured (right) power density distributionfor the TOP configuration over a 15 cm x 15 cm plane |
| 95 | Figure H.15 – Simulated (left) and measured (right) power density distributionfor the FRONT configuration over a 15 cm x 15 cm plane |
| 96 | Figure H.16 – Averaged power density as a function of distance for port 1, at 27,925 GHz, for TOP and FRONT configurations averaged over an area of 4 cm2 |
| 97 | Figure H.17 – Averaged power density as a function of averaging area for port 1at different frequencies |
| 98 | H.5 Measurements at Laboratory 3 H.5.1 General H.5.2 Measurement setup Figure H.18 – Distribution of the power density corresponding to the arraywith zero phase-shift between elements (configuration w1 of Table H.1) |
| 99 | H.5.3 Scans Figure H.19 – Measurement setup |
| 100 | Bibliography |
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BSI PD IEC TR 63170:2018
Measurement procedure for the evaluation of power density related to human exposure to radio frequency…
