{"id":233960,"date":"2024-10-19T15:15:31","date_gmt":"2024-10-19T15:15:31","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62951-22019\/"},"modified":"2024-10-25T09:46:50","modified_gmt":"2024-10-25T09:46:50","slug":"bs-iec-62951-22019","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62951-22019\/","title":{"rendered":"BS IEC 62951-2:2019"},"content":{"rendered":"
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin?film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.<\/p>\n
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 4 Test method 4.1 General <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 4.2 Test of electrical characteristics before bending Figure 1 \u2013 Procedure for measurement of flexible thin-film transistor <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.3 Test of electrical characteristics under bending Figure 2 \u2013 Schematic circuit diagram of the test <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4.4 Test report Figure 3 \u2013 Configuration for the TFT bending test <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Semiconductor devices. Flexible and stretchable semiconductor devices – Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices<\/b><\/p>\n |