CISPR 16-2-1:2014 is designated a basic standard, which specifies the methods of measurement of disturbance phenomena in general in the frequency range 9 kHz to 18 GHz and especially of conducted disturbance phenomena in the frequency range 9 kHz to 30 MHz. With a CDNE, the frequency range is 9 kHz to 300 Hz. This third edition cancels and replaces the second edition published in 2008, Amendment 1:2010 and Amendment 2:2013. This edition constitutes a technical revision which includes added methods of measurement using a new type of ancillary equipment: the CDNE. Key Words: electromagnetic compatibility, EMC, emissions, immunity<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 3 Terms, definitions and abbreviations 3.1 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 3.2 Abbreviations <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 4 Types of disturbance to be measured 4.1 General 4.2 Types of disturbance 4.3 Detector functions <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5 Connection of measuring equipment 5.1 General 5.2 Connection of ancillary equipment 5.3 Connections to RF reference ground <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.4 Connection between the EUT and the artificial mains network Figures Figure 1 \u2013 Example of a recommended test set-up with PE chokes with three AMNs and a sheath current absorber on the RF cable <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 6 General measurement requirements and conditions 6.1 General 6.2 Disturbance not produced by the equipment under test 6.2.1 General 6.2.2 Compliance testing 6.3 Measurement of continuous disturbance 6.3.1 Narrowband continuous disturbance 6.3.2 Broadband continuous disturbance <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 6.3.3 Use of spectrum analyzers and scanning receivers 6.4 EUT arrangement and measurement conditions 6.4.1 EUT arrangement <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 6.4.2 Normal load conditions 6.4.3 Duration of operation 6.4.4 Running-in\/warm-up time <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 6.4.5 Supply 6.4.6 Mode of operation 6.4.7 Operation of multifunction equipment 6.4.8 Determination of EUT arrangement(s) that maximize(s) emissions 6.4.9 Recording of measurement results 6.5 Interpretation of measuring results 6.5.1 Continuous disturbance <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 6.5.2 Discontinuous disturbance 6.5.3 Measurement of the duration of disturbances 6.6 Measurement times and scan rates for continuous disturbance 6.6.1 General 6.6.2 Minimum measurement times <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 6.6.3 Scan rates for scanning receivers and spectrum analyzers Tables Table 1 \u2013 Minimum scan times for the three CISPR bands with peak and quasi-peak detectors Table 2 \u2013 Minimum measurement times for the four CISPR bands <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | 6.6.4 Scan times for stepping receivers <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 6.6.5 Strategies for obtaining a spectrum overview using the peak detector Figure 2 \u2013 Measurement of a combination of a CW signal (\u201cNB\u201d) and an impulsive signal (\u201cBB\u201d) using multiple sweeps with maximum hold <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | Figure 3 \u2013 Example of a timing analysis <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | Figure 4 \u2013 A broadband spectrum measured with a stepped receiver Figure 5 \u2013 Intermittent narrowband disturbances measured using fast short repetitive sweeps with maximum hold function to obtain an overview of the disturbance spectrum <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | 6.6.6 Timing considerations using FFT-based instruments <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Figure 6 \u2013 FFT scan in segments Figure 7 \u2013 Frequency resolution enhanced by FFT-based measuring instrument <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 7 Measurement of disturbances conducted along leads, 9\u00a0kHz to 30\u00a0MHz 7.1 General 7.2 Measuring equipment (receivers, etc.) 7.2.1 General 7.2.2 Use of detectors for conducted disturbance measurements <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | 7.3 Ancillary measuring equipment 7.3.1 General 7.3.2 Artificial networks (ANs) 7.3.3 Voltage probes <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | 7.3.4 Current probes 7.4 Equipment under test configuration 7.4.1 Arrangement of the EUT and its connection to the AN Figure 8 \u2013 Illustration of current ICCM <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | Figure 9 \u2013 Test configuration: table-top equipment for conducted disturbance measurements on power mains <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | Figure 10 \u2013 Arrangement of EUT and AMN at 40 cm distance, with a) vertical RGP and b) horizontal RGP Figure 11 \u2013 Optional example test configuration for an EUT with only a power cord attached <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | Figure 12 \u2013 Test configuration: floor-standing equipment (see 7.4.1 and 7.5.2.3) <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | 7.4.2 Procedure for the measurement of unsymmetric disturbance voltages with V-networks (AMNs) Figure 13 \u2013 Example test configuration: floor-standing and table-top equipment(see 7.4.1 and 7.5.2.3) <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | Figure 14 \u2013 Schematic of disturbance voltage measurement configuration (see also 7.5.2.3) <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Figure 15 \u2013 Equivalent circuit for measurement of unsymmetric disturbance voltage for safety-class I (grounded) EUT <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | Figure 16 \u2013 Equivalent circuit for measurement of unsymmetric disturbancevoltage for safety-class II (ungrounded) EUT <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | Figure 17 \u2013 RC element for artificial hand Figure 18 \u2013 Portable electric drillwith artificial hand Figure 19 \u2013 Portable electric saw with artificial hand <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | 7.4.3 Measurement of common mode voltages at differential mode signal terminals <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | 7.4.4 Measurements using voltage probes <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | Figure 20 \u2013 Measuring example for voltage probes <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | Figure 21 \u2013 Measurement arrangement for two-terminal regulating controls <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | 7.4.5 Measurement using a capacitive voltage probe (CVP) 7.4.6 Measurements using current probes 7.5 System test configuration for conducted emissions measurements 7.5.1 General approach to system measurements <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | 7.5.2 System configuration <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | 7.5.3 Measurements of interconnecting lines <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | 7.5.4 Decoupling of system components 7.6 In situ measurements 7.6.1 General 7.6.2 Reference ground <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | 7.6.3 Measurement with voltage probes 7.6.4 Selection of measuring points 8 Automated measurement of disturbances 8.1 Precautions for automating measurements <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | 8.2 Generic measurement procedure 8.3 Prescan measurements Figure 22 \u2013 Generic process to help reduce measurement time <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | 8.4 Data reduction 8.5 Disturbance maximization and final measurement <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | 8.6 Post processing and reporting 8.7 Disturbance measurement strategies with FFT-based measuring instruments 9 Test set-up and measurement procedure using the CDNE in the frequency range 30\u00a0MHz to 300\u00a0MHz 9.1 General <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | 9.2 Test set-up <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | Figure 23 \u2013 Test set-up for measurement of an EUT with one cable Figure 24 \u2013 Test set-up for measurement of an EUT with two cables connected adjacent surfaces of the EUT <\/td>\n<\/tr>\n | ||||||
| 64<\/td>\n | 9.3 Measurement procedure Figure 25 \u2013 Test set-up for measurement of an EUT with two cables connected on the same surface of the EUT <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | Annex A (informative) Guidelines for connection of electrical equipment tothe artificial mains network A.1 General A.2 Classification of the possible cases A.2.1 Well-shielded but poorly filtered EUT (Figures A.1 and A.2) Figure A.1 \u2013 Basic schematic of well-shielded but poorly filtered EUT <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | A.2.2 Well-filtered but incompletely shielded EUT (Figures A.3 and A.4) A.2.3 Practical general case Figure A.2 \u2013 Detail of well-shielded but poorly filtered EUT Figure A.3 \u2013 Well-filtered but incompletely shielded EUT Figure A.4 \u2013 Well-filtered but incompletely shielded EUT, with U2 reduced to zero <\/td>\n<\/tr>\n | ||||||
| 67<\/td>\n | Figure A.5 \u2013 Disturbance supply through shielded conductors Figure A.6 \u2013 Disturbance supply through unshielded but filtered conductors <\/td>\n<\/tr>\n | ||||||
| 68<\/td>\n | A.3 Method of grounding A.4 Conditions of grounding A.4.1 General Figure A.7 \u2013 Disturbance supply through ordinary conductors <\/td>\n<\/tr>\n | ||||||
| 69<\/td>\n | A.4.2 Classification of typical testing conditions <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | A.5 Connection of the AMN as a voltage probe Figure A.8 \u2013 AMN configurations <\/td>\n<\/tr>\n | ||||||
| 71<\/td>\n | Table A.2 \u2013 Testing conditions for types of EUTs \u2013 Screened cable <\/td>\n<\/tr>\n | ||||||
| 72<\/td>\n | Annex B (informative) Use of spectrum analyzers and scanning receivers B.1 General B.2 Overload B.3 Linearity test B.4 Selectivity B.5 Normal response to pulses B.6 Peak detection <\/td>\n<\/tr>\n | ||||||
| 73<\/td>\n | B.7 Frequency scan rate B.8 Signal interception B.9 Average detection B.10 Sensitivity Table B.1 \u2013 Sweep time\/frequency or fastest scan rate <\/td>\n<\/tr>\n | ||||||
| 74<\/td>\n | B.11 Amplitude accuracy <\/td>\n<\/tr>\n | ||||||
| 75<\/td>\n | Annex C (informative) Decision tree for use of detectors for conducted disturbance measurements Figure C.1 \u2013 Decision tree for optimizing speed of conducted disturbance measurements with peak, quasi-peak and average detectors <\/td>\n<\/tr>\n | ||||||
| 77<\/td>\n | Annex D (informative) Scan rates and measurement times for use with the average detector D.1 General D.2 Suppression of impulsive disturbance D.2.1 General <\/td>\n<\/tr>\n | ||||||
| 78<\/td>\n | D.2.2 Suppression of impulsive disturbance by digital averaging D.3 Suppression of amplitude modulation D.4 Measurement of slowly intermittent, unsteady or drifting narrowband disturbances Table D.1 \u2013 Pulse suppression factors and scan rates for a 100\u00a0Hz video bandwidth <\/td>\n<\/tr>\n | ||||||
| 79<\/td>\n | Figure D.1 \u2013 Weighting function of a 10 ms pulse for peak (\u201cPK\u201d) and average detections with (\u201cCISPR AV\u201d) and without (\u201cAV\u201d) peak reading; meter time constant 160 ms Figure D.2 \u2013 Weighting functions of a 10\u00a0ms pulse for peak (\u201cPK\u201d) and average detections with (\u201cCISPR AV\u201d) and without (\u201cAV\u201d) peak reading; meter time constant 100\u00a0ms Table D.2 \u2013 Meter time constants and the corresponding video bandwidths and maximum scan rates <\/td>\n<\/tr>\n | ||||||
| 80<\/td>\n | D.5 Recommended procedure for automated or semi-automated measurements Figure D.3 \u2013 Example of weighting functions (of a 1\u00a0Hz pulse) for peak (\u201cPK\u201d) and average detections as a function of pulse width; meter time constant 160\u00a0ms Figure D.4 \u2013 Example of weighting functions (of a 1\u00a0Hz pulse) for peak (\u201cPK\u201d) and average detections as a function of pulse width; meter time constant 100\u00a0ms <\/td>\n<\/tr>\n | ||||||
| 81<\/td>\n | Annex E (informative) Guidelines for the improvement of the test set-up with ANs E.1 In situ verification of the AN impedance and voltage division factor Figure E.1 \u2013 Parallel resonance of enclosure capacitance and ground strap inductance <\/td>\n<\/tr>\n | ||||||
| 82<\/td>\n | Figure E.2 \u2013 Connection of an AMN to RGP using a wide grounding sheet for low inductance grounding Figure E.3 \u2013 Impedance measured with the arrangement of Figure E.2 both with reference to the front panel ground and to the grounding sheet Figure E.4 \u2013 VDF in the configuration of Figure E.2 measured with reference to the front panel ground and to the grounding sheet <\/td>\n<\/tr>\n | ||||||
| 83<\/td>\n | Figure E.5 \u2013 Arrangement showing the measurement grounding sheet (shown with dotted lines) when measuring the impedance with reference to RGP Figure E.6 \u2013 Impedance measured with the arrangement of Figure E.5 with reference to the RGP Figure E.7 \u2013 VDF measured with parallel resonances in the AMN grounding <\/td>\n<\/tr>\n | ||||||
| 84<\/td>\n | E.2 PE chokes and sheath current absorbers for the suppression of ground loops Figure E.8 \u2013 Attenuation of a sheath current absorber measuredin a 150 \u03a9 test arrangement <\/td>\n<\/tr>\n | ||||||
| 85<\/td>\n | Figure E.9 \u2013 Arrangement for the measurement of attenuation dueto PE chokes and sheath current absorbers <\/td>\n<\/tr>\n | ||||||
| 86<\/td>\n | Annex\u00a0F (normative)Determination of suitability of spectrum analyzersfor compliance tests Table F.1 \u2013 Maximum amplitude difference between peak and quasi-peak detected signals <\/td>\n<\/tr>\n | ||||||
| 87<\/td>\n | Annex G (informative) Basic guidance for measurements on telecommunications ports G.1 Limits <\/td>\n<\/tr>\n | ||||||
| 88<\/td>\n | G.2 Combination of current probe and capacitive voltage probe (CVP) G.3 Basic ideas of the capacitive voltage probe Table G.1 \u2013 Summary of advantages and disadvantages of the methods described in the specific subclauses of Annex H <\/td>\n<\/tr>\n | ||||||
| 89<\/td>\n | G.4 Combination of current limit and voltage limit <\/td>\n<\/tr>\n | ||||||
| 90<\/td>\n | Figure G.1 \u2013 Basic circuit for considering the limits with a defined TCM impedance of 150\u00a0\u03a9 Figure\u00a0G.2 \u2013 Basic circuit for the measurement with unknown TCM impedance <\/td>\n<\/tr>\n | ||||||
| 91<\/td>\n | G.5 Adjusting the TCM impedance with ferrites G.6 Ferrite specifications for use with methods of Annex\u00a0H <\/td>\n<\/tr>\n | ||||||
| 92<\/td>\n | Figure\u00a0G.3 \u2013 Impedance layout of the components used in Figure\u00a0H.2 <\/td>\n<\/tr>\n | ||||||
| 93<\/td>\n | Figure\u00a0G.4 \u2013 Basic test set-up to measure combined impedance of the 150\u00a0\u03a9 and ferrites <\/td>\n<\/tr>\n | ||||||
| 94<\/td>\n | Annex H (normative) Specific guidance for conducted disturbance measurements on telecommunication ports H.1 General Table H.1 \u2013 Telecommunication port disturbance measurement procedure selection <\/td>\n<\/tr>\n | ||||||
| 95<\/td>\n | H.2 Characteristics of AANs Table\u00a0H.2 \u2013 aLCL values <\/td>\n<\/tr>\n | ||||||
| 96<\/td>\n | H.3 Characteristics of current probe H.4 Characteristics of capacitive voltage probe H.5 Procedures for common mode measurements H.5.1 General H.5.2 Measurement procedure using AANs <\/td>\n<\/tr>\n | ||||||
| 97<\/td>\n | H.5.3 Measurement procedure using a 150 \u03a9 load connected to the outside surfaceof the cable screen Figure H.1 \u2013 Measurement set-up using an AAN <\/td>\n<\/tr>\n | ||||||
| 98<\/td>\n | H.5.4 Measurement procedure using a combination of current probe and capacitivevoltage probe Figure\u00a0H.2 \u2013 Measurement set-up using a 150\u00a0\u03a9 loadto the outside surface of the shield <\/td>\n<\/tr>\n | ||||||
| 99<\/td>\n | H.5.5 Measurement of cable, ferrite and AE common mode impedance Figure\u00a0H.3 \u2013 Measurement set-up using current and capacitive voltage probes <\/td>\n<\/tr>\n | ||||||
| 100<\/td>\n | Figure\u00a0H.4 \u2013 Characterization set-up <\/td>\n<\/tr>\n | ||||||
| 101<\/td>\n | Annex\u00a0I (informative)Examples of AANs and ANs for screened cables Figure I.1 \u2013 Example AAN for use with unscreened single balanced pairs <\/td>\n<\/tr>\n | ||||||
| 102<\/td>\n | Figure\u00a0I.2 \u2013 Example AAN with high LCL for use with either one or two unscreened balanced pairs <\/td>\n<\/tr>\n | ||||||
| 103<\/td>\n | Figure\u00a0I.3 \u2013 Example AAN with high LCL for usewith one, two, three, or four unscreened balanced pairs <\/td>\n<\/tr>\n | ||||||
| 104<\/td>\n | Figure\u00a0I.4 \u2013 Example AAN, including a 50 \u03a9 source matching network at the voltage measuring port, for use with two unscreened balanced pairs <\/td>\n<\/tr>\n | ||||||
| 105<\/td>\n | Figure\u00a0I.5 \u2013 Example AAN for use with two unscreened balanced pairs <\/td>\n<\/tr>\n | ||||||
| 106<\/td>\n | Figure\u00a0I.6 \u2013 Example AAN, including a 50\u00a0\u03a9 source matching network at the voltage measuring port, for use with four unscreened balanced pairs <\/td>\n<\/tr>\n | ||||||
| 107<\/td>\n | Figure\u00a0I.7 \u2013 Example AAN for use with four unscreened balanced pairs <\/td>\n<\/tr>\n | ||||||
| 108<\/td>\n | Figure\u00a0I.8 \u2013 Example AN for use with coaxial cables, employing an internal common mode choke created by bifilar winding an insulated centre-conductor wireand an insulated screen-conductor wire on a common magnetic core(for example, a ferrite toroid) Figure\u00a0I.9 \u2013 Example AN for use with coaxial cables, employing an internal common mode choke created by miniature coaxial cable (miniature semi-rigid solid copper screen or miniature double-braided screen coaxial cable) wound on ferrite toroids <\/td>\n<\/tr>\n | ||||||
| 109<\/td>\n | Figure\u00a0I.10 \u2013 Example AN for use with multi-conductor screened cables, employing an internal common mode choke created by bifilar winding multiple insulated signal wires and an insulated screen-conductor wire on a common magnetic core (for example, a ferrite toroid) Figure\u00a0I.11 \u2013 Example AN for use with multi-conductor screened cables, employing an internal common mode choke created by winding a multi-conductor screened cable on ferrite toroids <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Specification for radio disturbance and immunity measuring apparatus and methods – Methods of measurement of disturbances and immunity. Conducted disturbance measurements<\/b><\/p>\n |