{"id":420865,"date":"2024-10-20T06:33:16","date_gmt":"2024-10-20T06:33:16","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-62884-12017-2\/"},"modified":"2024-10-26T12:15:50","modified_gmt":"2024-10-26T12:15:50","slug":"bs-en-62884-12017-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-62884-12017-2\/","title":{"rendered":"BS EN 62884-1:2017"},"content":{"rendered":"

This part of IEC 62884 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as “Oscillator”).<\/p>\n

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NOTE Dielectric Resonator Oscillators (DROs) and oscillators using FBAR are under consideration.<\/p>\n<\/blockquote>\n

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PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
5<\/td>\nAnnex ZA(normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n
7<\/td>\nCONTENTS <\/td>\n<\/tr>\n
11<\/td>\nFOREWORD <\/td>\n<\/tr>\n
13<\/td>\n1 Scope
2 Normative references <\/td>\n<\/tr>\n
14<\/td>\n3 Terms and definitions
3.1 General <\/td>\n<\/tr>\n
15<\/td>\n3.2 Terms and definitions
4 Test and measurement procedures
4.1 General
4.2 Test and measurement conditions
4.2.1 Standard conditions for testing
4.2.2 Equilibrium conditions
4.2.3 Air flow conditions for temperature tests <\/td>\n<\/tr>\n
16<\/td>\n4.2.4 Power supplies
4.2.5 Precision of measurement
4.2.6 Precautions
4.2.7 Alternative test methods
4.3 Visual inspection
4.3.1 General
4.3.2 Visual test A
4.3.3 Visual test B <\/td>\n<\/tr>\n
17<\/td>\n4.3.4 Visual test C
4.4 Dimensions and gauging procedures
4.4.1 Dimensions \u2013 Test A
4.4.2 Dimensions \u2013 Test B
4.5 Electrical test procedures
4.5.1 Insulation resistance
4.5.2 Voltage proof
Figures
Figure 1 \u2013 Test circuits for insulation resistance measurements <\/td>\n<\/tr>\n
18<\/td>\n4.5.3 Input power
Figure 2 \u2013 Test circuit for voltage proof test
Figure 3 \u2013 Test circuit for oscillator input power measurement <\/td>\n<\/tr>\n
19<\/td>\n4.5.4 Output frequency
Figure 4 \u2013 Test circuit for oven and oscillator input power measurement <\/td>\n<\/tr>\n
20<\/td>\n4.5.5 Frequency\/temperature characteristics
Figure 5 \u2013 Test circuit for measurement of output frequency, method1
Figure 6 \u2013 Test circuit for measurement of output frequency, method 2 <\/td>\n<\/tr>\n
21<\/td>\n4.5.6 Frequency\/load coefficient
Figure 7 \u2013 Test circuit for measurement of frequency\/temperature characteristics <\/td>\n<\/tr>\n
22<\/td>\n4.5.7 Frequency\/voltage coefficient
4.5.8 Frequency stability with thermal transient <\/td>\n<\/tr>\n
23<\/td>\n4.5.9 Oscillation start-up
Figure 8 \u2013 Thermal transient behaviour of typical oscillator <\/td>\n<\/tr>\n
24<\/td>\nFigure 9 \u2013 Generalized oscillator circuit <\/td>\n<\/tr>\n
25<\/td>\nFigure 10 \u2013 Test circuit for start-up behaviour and start-up time measurement
Figure 11 \u2013 Typical start-up behaviour with slow supply voltage ramp <\/td>\n<\/tr>\n
26<\/td>\nFigure 12 \u2013 Definition of start-up time <\/td>\n<\/tr>\n
27<\/td>\n4.5.10 Stabilization time
4.5.11 Frequency adjustment range
4.5.12 Retrace characteristics
Figure 13 \u2013 Supply voltage waveform for periodical tSU measurement
Figure 14 \u2013 Typical oscillator stabilization characteristic <\/td>\n<\/tr>\n
28<\/td>\n4.5.13 Oscillator output voltage (sinusoidal)
Figure 15 \u2013 Example of retrace characteristic <\/td>\n<\/tr>\n
29<\/td>\n4.5.14 Oscillator output voltage (pulse waveform)
Figure 16 \u2013 Test circuit for the measurement of output voltage
Figure 17 \u2013 Test circuit for the measurement of pulse outputs
Figure 18 \u2013 Characteristics of an output waveform <\/td>\n<\/tr>\n
30<\/td>\n4.5.15 Oscillator output waveform (sinusoidal)
Figure 19 \u2013 Test circuit for harmonic distortion measurement
Figure 20 \u2013 Quasi-sinusoidal output waveforms <\/td>\n<\/tr>\n
31<\/td>\nFigure 21 \u2013 Frequency spectrum for harmonic distortion <\/td>\n<\/tr>\n
32<\/td>\n4.5.16 Oscillator output waveform (pulse)
4.5.17 Oscillator output power (sinusoidal)
4.5.18 Oscillator output impedance (sinusoidal) <\/td>\n<\/tr>\n
33<\/td>\n4.5.19 Re-entrant isolation
4.5.20 Output suppression of gated oscillators
Figure 22 \u2013 Test circuit for the determination of isolation between output ports <\/td>\n<\/tr>\n
34<\/td>\n4.5.21 3-state output characteristics
Figure 23 \u2013 Test circuit for measuring suppression of gated oscillators
Figure 24 \u2013 Test circuit for 3-state disable mode output current <\/td>\n<\/tr>\n
35<\/td>\n4.5.22 Amplitude modulation characteristics
Figure 25 \u2013 Test circuit for output gating time \u2013 3-state <\/td>\n<\/tr>\n
36<\/td>\nFigure 26 \u2013 Test circuit for modulation index measurement
Figure 27 \u2013 Modulation waveform for index calculation
Figure 28 \u2013 Logarithmic signal amplitude scale <\/td>\n<\/tr>\n
38<\/td>\nFigure 29 \u2013 Test circuit to determine amplitude modulation sensitivity
Figure 30 \u2013 Frequency spectrum of amplitude modulation distortion <\/td>\n<\/tr>\n
39<\/td>\nFigure 31 \u2013 Test circuit to determine pulse amplitude modulation <\/td>\n<\/tr>\n
40<\/td>\nFigure 32 \u2013 Pulse modulation characteristic <\/td>\n<\/tr>\n
41<\/td>\n4.5.23 Frequency modulation characteristics
Figure 33 \u2013 Test circuit for the determination of modulation input impedance
Figure 34 \u2013 Test circuit for the measurement of f.m. deviation <\/td>\n<\/tr>\n
43<\/td>\nFigure 35 \u2013 Test circuit for the measurement of f.m. sensitivity <\/td>\n<\/tr>\n
44<\/td>\nFigure 36 \u2013 Test circuit for the measurement of frequency modulation distortion <\/td>\n<\/tr>\n
45<\/td>\n4.5.24 Spurious response
4.5.25 Phase noise
Figure 37 \u2013 Test circuit for the measurement of single-sideband phase noise <\/td>\n<\/tr>\n
46<\/td>\n4.5.26 Phase noise \u2013 vibration
4.5.27 Phase noise \u2013 acoustic <\/td>\n<\/tr>\n
47<\/td>\n4.5.28 Noise pedestal
Figure 38 \u2013 Typical noise pedestal spectrum <\/td>\n<\/tr>\n
48<\/td>\n4.5.29 Spectral purity
4.5.30 Incidental frequency modulation <\/td>\n<\/tr>\n
49<\/td>\n4.5.31 RMS fractional frequency fluctuations
Figure 39 \u2013 Test circuit for the measurement of incidental frequency modulation <\/td>\n<\/tr>\n
50<\/td>\nFigure 40 \u2013 Test circuit for method 1 <\/td>\n<\/tr>\n
51<\/td>\nFigure 41 \u2013 Test circuit for method 2 <\/td>\n<\/tr>\n
52<\/td>\nFigure 42 \u2013 Circuit modifications for methods 1 and 2 <\/td>\n<\/tr>\n
53<\/td>\n4.5.32 Electromagnetic interference (radiated)
Figure 43 \u2013 Time-domain short-term frequency stability of a typical 5 MHz precision oscillator <\/td>\n<\/tr>\n
54<\/td>\nFigure 44 \u2013 Radiated interference tests <\/td>\n<\/tr>\n
55<\/td>\nFigure 45 \u2013 Characteristics of line impedance of stabilizing network <\/td>\n<\/tr>\n
56<\/td>\nFigure 46 \u2013 Circuit diagram of line impedance of stabilizing network <\/td>\n<\/tr>\n
57<\/td>\n4.6 Mechanical and environmental test procedures
4.6.1 Robustness of terminations (destructive)
Tables
Table 1 \u2013 Measuring sets bandwidth
Table 2 \u2013 Tensile force <\/td>\n<\/tr>\n
58<\/td>\nTable 3 \u2013 Thrust force
Table 4 \u2013 Bending force <\/td>\n<\/tr>\n
59<\/td>\n4.6.2 Sealing test (non-destructive)
4.6.3 Soldering (solderability and resistance to soldering heat) (destructive)
Table 5 \u2013 Torque force <\/td>\n<\/tr>\n
60<\/td>\nFigure 47 \u2013 Reflow temperature profile for solderability
Table 6 \u2013 Solderability \u2013 Test condition, reflow method <\/td>\n<\/tr>\n
61<\/td>\nFigure 48 \u2013 Reflow temperature profile for resistance to soldering heat <\/td>\n<\/tr>\n
62<\/td>\n4.6.4 Rapid change of temperature: severe shock by liquid immersion (non- destructive)
4.6.5 Rapid change of temperature: thermal shock in air (non-destructive)
4.6.6 Bump (destructive)
Table 7 \u2013 Resistance to soldering heat \u2013 Test condition and severity, reflow method <\/td>\n<\/tr>\n
63<\/td>\n4.6.7 Vibration (destructive)
4.6.8 Shock (destructive) <\/td>\n<\/tr>\n
64<\/td>\n4.6.9 Free fall (destructive)
4.6.10 Acceleration, steady-state (non-destructive)
4.6.11 Acceleration \u2013 2g tip over
4.6.12 Acceleration noise
4.6.13 Low air pressure (non-destructive)
4.6.14 Dry heat (non-destructive)
4.6.15 Damp heat, cyclic (destructive) <\/td>\n<\/tr>\n
65<\/td>\n4.6.16 Cold (non-destructive)
4.6.17 Climatic sequence (destructive)
4.6.18 Damp heat, steady-state (destructive)
4.6.19 Salt mist, cyclic (destructive)
4.6.20 Mould growth (non-destructive)
4.6.21 Immersion in cleaning solvent (non-destructive)
4.6.22 Radiation hardness <\/td>\n<\/tr>\n
66<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Basic methods for the measurement<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2017<\/td>\n68<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":420872,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-420865","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/420865","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/420872"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=420865"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=420865"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=420865"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}