{"id":424800,"date":"2024-10-20T06:53:28","date_gmt":"2024-10-20T06:53:28","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-cen-tr-103542011-2\/"},"modified":"2024-10-26T12:58:10","modified_gmt":"2024-10-26T12:58:10","slug":"bsi-pd-cen-tr-103542011-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-cen-tr-103542011-2\/","title":{"rendered":"BSI PD CEN\/TR 10354:2011"},"content":{"rendered":"

This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials.<\/p>\n

The method is applicable to:<\/p>\n