{"id":79794,"date":"2024-10-17T18:38:00","date_gmt":"2024-10-17T18:38:00","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1140-1994\/"},"modified":"2024-10-24T19:41:24","modified_gmt":"2024-10-24T19:41:24","slug":"ieee-1140-1994","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1140-1994\/","title":{"rendered":"IEEE 1140 1994"},"content":{"rendered":"

New IEEE Standard – Active. Procedures for the measurement of electric and magnetic fields in close proximity to video display terminals (VDTs) in the frequency range of 5 Hz to 400 kHz are provided. Existing international measurement technologies and practices are adapted to achieve a consistent and harmonious VDT measurement standard for testing in a laboratory controlled environment.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nTitle page <\/td>\n<\/tr>\n
3<\/td>\nIntroduction
Participants <\/td>\n<\/tr>\n
5<\/td>\nCONTENTS <\/td>\n<\/tr>\n
7<\/td>\n1. Scope
2. Definitions <\/td>\n<\/tr>\n
8<\/td>\n3. General conditions
3.1 General <\/td>\n<\/tr>\n
9<\/td>\n3.2 Background electric field levels
3.3 Background magnetic field (magnetic flux density) <\/td>\n<\/tr>\n
10<\/td>\n4. Electric field test equipment
4.1 Electric field measuring probe <\/td>\n<\/tr>\n
11<\/td>\n4.2 Probe filters and signal processing
4.3 Calibration <\/td>\n<\/tr>\n
12<\/td>\n5. Electric field strength measurement procedure
5.1 VDT test setup
5.2 Measurement procedure <\/td>\n<\/tr>\n
13<\/td>\n5.3 Measurement uncertainty <\/td>\n<\/tr>\n
15<\/td>\n6. Magnetic field test equipment
6.1 Magnetic field measuring probe <\/td>\n<\/tr>\n
16<\/td>\n6.2 Probe filters and signal processing
6.3 Calibration <\/td>\n<\/tr>\n
17<\/td>\n7. Magnetic flux density measurement procedure
7.1 VDT test setup
7.2 Measurement procedure <\/td>\n<\/tr>\n
19<\/td>\n7.3 Measurement uncertainty <\/td>\n<\/tr>\n
21<\/td>\n8. Bibliography <\/td>\n<\/tr>\n
22<\/td>\nAnnex A\u2014Electric field measuring probe\u2014principle of operation <\/td>\n<\/tr>\n
25<\/td>\nAnnex B\u2014VDT characterization\u2014typical data recording format <\/td>\n<\/tr>\n
26<\/td>\nAnnex C\u2014Measurement uncertainty\u2014typical data recording format <\/td>\n<\/tr>\n
27<\/td>\nAnnex D\u2014Measurement instrumentation used <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard Procedures for the Measurement of Electric and Magnetic Fields from Video Display Terminals (VDTs) from 5 Hz to 400 kHz<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n1994<\/td>\n27<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":79795,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-79794","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/79794","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/79795"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=79794"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=79794"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=79794"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}