IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers: – the emission of RF disturbances, – the immunity against RF disturbances, – the immunity against impulses and – the immunity against electrostatic discharges (ESD).<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 11<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 3 Terms, definitions and abbreviations 3.1 Terms and definitions 3.2 Abbreviations 4 General <\/td>\n<\/tr>\n | ||||||
| 13<\/td>\n | 5 Test and operating conditions 5.1 Supply and ambient conditions Tables Table 1 \u2013 Overview of required measurements and tests <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5.2 Test operation modes 5.3 Test configuration 5.3.1 General test configuration for functional test Figures Figure 1 \u2013 General test configuration for tests in functional operation modes Table 2 \u2013 Supply and ambient conditions for functional operation <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 5.3.2 General test configuration for unpowered ESD test 5.3.3 Coupling ports and coupling networks for functional tests Figure 2 \u2013 General test configuration for unpowered ESD test Figure 3 \u2013 Coupling ports and networks for functional tests <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | 5.3.4 Coupling ports and coupling networks for unpowered ESD tests Figure 4 \u2013 Coupling ports and networks for unpowered ESD tests Table 3 \u2013 Definition of coupling ports and coupling network component values for functional tests <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 5.4 Test signals 5.4.1 General 5.4.2 Test signals for normal operation mode Table 4 \u2013 Definitions of coupling ports for unpowered ESD tests Table 5 \u2013 Communication test signal TX1 <\/td>\n<\/tr>\n | ||||||
| 18<\/td>\n | 5.4.3 Test signal for wake-up from sleep mode 5.5 Evaluation criteria 5.5.1 General Table 6 \u2013 Communication test signal TX2 Table 7 \u2013 Wake-up test signal TX3 <\/td>\n<\/tr>\n | ||||||
| 19<\/td>\n | 5.5.2 Evaluation criteria in functional operation modes during exposure to disturbances Table 8 \u2013 Evaluation criteria for Standard LIN transceiver IC in functional operation modes <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 5.5.3 Evaluation criteria in unpowered condition after exposure to disturbances Figure 5 \u2013 Principal drawing of the maximum deviation on an IV\u00a0characteristic Table 9 \u2013 Evaluation criteria for ICs with embedded LIN transceiver in functional operation modes <\/td>\n<\/tr>\n | ||||||
| 21<\/td>\n | 5.5.4 Status classes 6 Test and measurement 6.1 Emission of RF disturbances 6.1.1 Test method 6.1.2 Test setup Table 10 \u2013 Definition of functional status classes <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 6.1.3 Test procedure and parameters Figure 6 \u2013 Test setup for measurement of RF disturbances Table 11 \u2013 Parameters for emission measurements <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | 6.2 Immunity to RF disturbances 6.2.1 Test method 6.2.2 Test setup Figure 7 \u2013 Test setup for DPI tests Table 12 \u2013 Settings of the RF measurement equipment <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 6.2.3 Test procedure and parameters Table 13 \u2013 Specifications for DPI tests <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | Table 14 \u2013 Required DPI tests for functional status class AIC evaluation of standard LIN transceiver ICs <\/td>\n<\/tr>\n | ||||||
| 26<\/td>\n | 6.3 Immunity to impulses 6.3.1 Test method Table 15 \u2013 Required DPI tests for functional status class AIC evaluation of ICs with embedded LIN transceiver Table 16 \u2013 Required DPI tests for functional status class CIC or DIC evaluation of standard LIN transceiver ICs and ICs with embedded LIN transceiver <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 6.3.2 Test setup 6.3.3 Test procedure and parameters Figure 8 \u2013 Test setup for impulse immunity tests <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | Table 17 \u2013 Specifications for impulse immunity tests Table 18 \u2013 Parameters for impulse immunity test <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | Table 19 \u2013 Required impulse immunity tests for functional status class AIC evaluation of standard LIN transceiver ICs Table 20 \u2013 Required impulse immunity tests for functional status class AIC evaluation of ICs with embedded LIN transceiver <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 6.4 Electrostatic Discharge (ESD) 6.4.1 Test method 6.4.2 Test setup Table 21 \u2013 Required impulse immunity tests for functional status class CIC or DIC evaluation of standard LIN transceiver ICs and ICs with embedded LIN transceiver <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | Figure 9 \u2013 Test setup for direct ESD tests <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 6.4.3 Test procedure and parameters 7 Test report Table 22 \u2013 Recommendations for direct ESD tests <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | Annex A (normative) LIN test circuits A.1 General A.2 LIN test circuit for standard LIN transceiver ICs for functional tests <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | Figure A.1 \u2013 General drawing of the circuit diagram of test network for standard LIN transceiver ICs for functional test <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | A.3 LIN test circuit for IC with embedded LIN transceiver for functional tests <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | A.4 LIN test circuit for LIN transceiver ICs for unpowered ESD test Figure A.2 \u2013 General drawing of the circuit diagram of the test network for ICs with embedded LIN transceiver for functional test Figure A.3 \u2013 General drawing of the circuit diagram for direct ESD tests of LIN transceiver ICs in unpowered mode <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | Annex B (normative) Test circuit boards B.1 Test circuit board for functional tests B.2 ESD test Figure B.1 \u2013 Example of IC interconnections of LIN signal <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | Figure B.2 \u2013 Example of ESD test board for LIN transceiver ICs Table B.1 \u2013 Parameter ESD test circuit board <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | Annex C (informative) Examples for test limits for LIN transceiver in automotive application C.1 General C.2 Emission of RF disturbances <\/td>\n<\/tr>\n | ||||||
| 40<\/td>\n | C.3 Immunity to RF disturbances Figure C.1 \u2013 Example of limits for RF emission Figure C.2 \u2013 Example of limits for RF immunity for functional status class AIC <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | C.4 Immunity to impulses C.5 Electrostatic Discharge (ESD) Figure C.3 \u2013 Example of limits for RF immunity for functional status class CIC or DIC Table C.1 \u2013 Example of limits for impulse immunity for functional status class CIC or DIC <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Annex D (informative) Test of indirect ESD discharge D.1 General D.2 Test setup Figure D.1 \u2013 Test setup for indirect ESD tests <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | D.3 Typical current wave form for indirect ESD test D.4 Test procedure and parameters Figure D.2 \u2013 Example of ESD current wave form for indirect ESD test at VESD\u00a0=\u00a08\u00a0kV <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | Table D.1 \u2013 Specifications for indirect ESD tests <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Integrated circuits. EMC evaluation of transceivers – LIN transceivers<\/b><\/p>\n |