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ASTM-E1426:1998 Edition

ASTM-E1426:1998 Edition

$35.75

E1426-98 Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress

Published By Publication Date Number of Pages
ASTM 1998 11
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ASTM E1426-98

Historical Standard: Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress

ASTM E1426

Scope

1.1 This test method covers a procedure for experimentally determining the effective elastic parameter, Eeff , for the evaluation of residual and applied stresses by X-ray diffraction techniques. The effective elastic parameter relates macroscopic stress to the strain measured in a particular crystallographic direction in polycrystalline samples. Eeff should not be confused with E, the modulus of elasticity. Rather, it is nominally equivalent to E/(1 + [nu]) for the particular crystallographic direction, where [nu] is Poisson’s ratio. The effective elastic parameter is influenced by elastic anisotropy and preferred orientation of the sample material.

1.2 This test method is applicable to all X-ray diffraction instruments intended for measurements of macroscopic residual stress that use measurements of the positions of the diffraction peaks in the high back-reflection region to determine changes in lattice spacing.

1.3 This test method is applicable to all X-ray diffraction techniques for residual stress measurement, including single, double, and multiple exposure techniques.

1.4 The values stated in inch pound units are to be regarded as the standard. The SI units given in parentheses are for information only.

1.5 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

Crystal lattice structure; Effective elastic parameter (Eeff); Macroscopic analysis; Polycrystalline materials; Residual stress; Stress; X-ray diffraction; effective elastic parameter (Eeff) for X-ray diffraction measurements of; residual stress, test

ICS Code

ICS Number Code n/a

DOI: 10.1520/E1426-98

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