ASTM-F1996:2000 Edition
$35.75
F1996-00 Standard Test Method for Silver Migration for Membrane Switch Circuitry
Published By | Publication Date | Number of Pages |
ASTM | 2000 |
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.