BS EN 60749-5:2017
$102.76
Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life test
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 16 |
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This test method is considered destructive.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 7 | CONTENTS |
| 8 | FOREWORD |
| 10 | 1 Scope 2 Normative references 3 Terms and definitions 4 General |
| 11 | 5 Equipment 5.1 Equipment summary 5.2 Temperature and relative humidity 5.3 Devices under stress 5.4 Minimizing release of contamination 5.5 Ionic contamination 5.6 Deionized water 6 Test conditions 6.1 Test conditions summary 6.2 Temperature, relative humidity and duration Table 1 – Temperature, relative humidity and duration |
| 12 | 6.3 Biasing guidelines 6.4 Biasing choice and reporting |
| 13 | 7 Procedures 7.1 Mounting 7.2 Ramp-up 7.3 Ramp-down 7.4 Test clock 7.5 Bias 7.6 Read-out Table 2 – Criteria for choosing continuous or cyclical bias |
| 14 | 7.7 Handling 8 Failure criteria 9 Safety 10 Summary |
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BS EN 60749-5:2017 – TC:2020 Edition
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Steady-state temperature humidity bias life…
