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BS EN IEC 61215-1:2021

BS EN IEC 61215-1:2021

$198.66

Terrestrial photovoltaic (PV) modules. Design qualification and type approval – Test requirements

Published By Publication Date Number of Pages
BSI 2021 54
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This document lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime.

In climates where 98th percentile operating temperatures exceed 70 °C, users are recommended to consider testing to higher temperature test conditions as described in IEC TS 63126. Users desiring qualification of PV products with lesser lifetime expectations are recommended to consider testing designed for PV in consumer electronics, as described in IEC TS 63163 (under development). Users wishing to gain confidence that the characteristics tested in IEC 61215 appear consistently in a manufactured product may wish to utilize IEC 62941 regarding quality systems in PV manufacturing.

This document is intended to apply to all terrestrial flat plate module materials such as crystalline silicon module types as well as thin-film modules. It does not apply to systems that are not long-term applications, such as flexible modules installed in awnings or tenting.

This document does not apply to modules used with concentrated sunlight although it may be utilized for low concentrator modules (1 to 3 suns). For low concentration modules, all tests are performed using the irradiance, current, voltage and power levels expected at the design concentration.

This document does not address the particularities of PV modules with integrated electronics. It may however be used as a basis for testing such PV modules.

The objective of this test sequence is to determine the electrical characteristics of the module and to show, as far as possible within reasonable constraints of cost and time, that the module is capable of withstanding prolonged exposure outdoors. Accelerated test conditions are empirically based on those necessary to reproduce selected observed field failures and are applied equally across module types. Acceleration factors may vary with product design, and thus not all degradation mechanisms may manifest. Further general information on accelerated test methods including definitions of terms may be found in IEC 62506.

Some long-term degradation mechanisms can only reasonably be detected via component testing, due to long times required to produce the failure and necessity of stress conditions that are expensive to produce over large areas. Component tests that have reached a sufficient level of maturity to set pass/fail criteria with high confidence are incorporated into the IEC 61215 series via addition to Table 1. In contrast, the tests procedures described in this series, in IEC 61215-2, are performed on modules.

PDF Catalog

PDF Pages PDF Title
2 undefined
5 Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
7 English
CONTENTS
9 FOREWORD
11 INTRODUCTION
12 1 Scope
2 Normative references
14 3 Terms, definitions and abbreviated terms
15 Figure 1 – Geometry that shows radius of curvature of a flexible module
16 4 Test samples
18 5 Marking and documentation
5.1 Name plate
5.2 Documentation
5.2.1 Minimum requirements
5.2.2 Information to be given in the documentation
20 5.2.3 Assembly instructions
6 Testing
22 7 Pass criteria
7.1 General
Figure 2 – Full test flow for design qualification and type approval of photovoltaic modules
Table 1 – Required component tests
Table 2 – Summary of Gate No. 1 requirements
23 7.2 Power output and electric circuitry
7.2.1 Identification of rated values and tolerances
25 7.2.2 Verification of rated label values → Gate No. 1
Figure 3 – Examples of hypothetical partial nameplates (left column), datasheets (center column), and derived rated values and tolerances (right column)
28 7.2.3 Maximum power degradation during type approval testing → Gate No. 2
7.2.4 Electrical circuitry
7.3 Visual defects
7.4 Electrical safety
29 8 Major visual defects
9 Report
30 10 Modifications
31 11 Test flow and procedures
Table 3 – Summary of test levels
33 Annex A (informative) Changes from previous edition
A.1 General
A.2 Procedures for bifacial modules
35 A.3 Use of representative samples
36 A.4 Addition of dynamic mechanical load test
A.5 Addition of test for potential induced degradation
38 A.6 Simulator requirements
A.6.1 General
39 A.6.2 Rationale for changes to spectral requirements
40 A.6.3 Rationale for changes to uniformity requirements
Table A.1 – Published uncertainty values as a function of simulator uniformity class
41 A.7 References to retest guidelines
A.8 Weight on junction boxes
A.9 Correction to monolithically-integrated hot-spot endurance test
43 A.10 Number of modules in sequence
Figure A.1 – Derived temperature coefficients (α) for nine different mc‑Si products types
44 A.11 Removal of nominal module operating temperature (NMOT)
45 A.12 Very low currents during thin-film tests
A.13 Limit bypass diode testing to three diodes
A.14 Revert the insulation test to 2005 version
Table A.2 – Summary of foil placement during insulation test in three different versions.
46 A.15 Bending test
A.16 Stabilization option for boron oxygen LID (MQT 19.3)
47 Bibliography

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BS EN IEC 61215-1:2021
$198.66