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BS ISO 25498:2010

BS ISO 25498:2010

$167.15

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope

Published By Publication Date Number of Pages
BSI 2010 40
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Status

Withdrawn
Title

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
Publisher

BSI
Committee

CII/9
Pages

40
Publication Date

2010-06-30
Withdrawn Date

2018-03-23
Replaced By

BS ISO 25498:2018
ISBN

978 0 580 57853 3
Standard Number

BS ISO 25498:2010
Identical National Standard Of

ISO 25498:2010
Descriptors

Microanalysis, Test specimens, Electron microscopes, Spectroscopy, Optical instruments, Electron beams, Electron diffraction, Crystal lattices, Chemical analysis and testing
ICS Codes 71.040.50 - Physicochemical methods of analysis
BS ISO 25498:2010
$167.15