IEEE 1057-2017

$91.00

IEEE Standard for Digitizing Waveform Recorders

Published By	Publication Date	Number of Pages
IEEE	2017

Guaranteed Safe Checkout

Category: IEEE

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

Revision Standard – Active. Terminology and test methods for describing the performance of waveform recorders are presented in this standard.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1057™-2017 Front cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents
7	Participants
8	Introduction
9	Contents
12	List of Figures
15	List of Tables
16	IMPORTANT NOTICE 1. Overview 1.1 Scope 1.2 Waveform recorder background
17	2. Normative references
18	3. Definitions 3.1 Definitions
25	3.2 Symbols and acronyms
29	4. Test parameters and methods 4.1 Manufacturer supplied information
32	4.2 Test selection
33	4.3 Test setup
40	4.4 Equivalent-time sampling
44	4.5 Discrete Fourier transform (DFT)
53	4.6 Sine wave testing and fitting
60	4.7 Locating code transition levels
78	4.8 Step function response measurements
81	4.9 Tests using a dc input
82	5. Input impedance 5.1 Test method 5.2 Alternate test method using a time domain reflectometer (TDR) 5.3 Input impedance for out-of-range signals
84	6. Static gain and offset 6.1 Independently based gain and offset
86	6.2 Terminal-based gain and offset 7. Linearity 7.1 Integral nonlinearity (INL)
87	7.2 Maximum static error (MSE) 7.3 Differential nonlinearity (DNL) and missing codes
88	7.4 Example INL and DNL data
90	7.5 Monotonicity
91	7.6 Hysteresis
92	7.7 Total harmonic distortion (THD)
97	7.8 Intermodulation distortion (IMD)
99	7.9 Noise power ratio (NPR)
105	8. Noise7
106	8.1 Comments on noise 8.2 Ratio of signal to noise and distortion (SINAD)
107	8.3 Signal to noise ratio (SNR) 8.4 Comments on SINAD and SNR
108	8.5 Effective number of bits (ENOB)
111	8.6 Random noise
112	8.7 Spurious components
113	8.8 Spurious-free dynamic range (SFDR)
114	9. Step response parameters 9.1 Settling parameters
118	9.2 Transition duration of the step response
120	9.3 Slew rate limit 9.4 Overshoot and precursors 9.5 Aperture duration
125	9.6 Limitations on the use of step responses
128	10. Frequency response parameters 10.1 Analog bandwidth 10.2 Gain error (gain flatness)
129	10.3 Frequency response and gain from step response
134	11. Interchannel parameters 11.1 Crosstalk 11.2 Multiple input reverse coupling
135	12. Time base parameters 12.1 Fixed error in sample time 12.2 Aperture uncertainty
137	12.3 Long-term stability
138	13. Out-of-range recovery
139	13.1 Test method for absolute out-of-range voltage recovery 13.2 Test method for relative out-of-range voltage recovery 13.3 Comments on test method 14. Word error rate 14.1 Test method for word error rate
140	14.2 Comment on the number of samples required for word error rate 14.3 Comments on test equipment and making measurements 15. Differential input specifications 15.1 Differential input impedance to ground
141	15.2 Common-mode rejection ratio (CMRR) and maximum common-mode signal level 15.3 Maximum operating common-mode signal
142	15.4 Common-mode out-of-range signal recovery time 16. Cycle time 16.1 Test method
143	16.2 Comment 17. Triggering 17.1 Trigger delay and trigger jitter
144	17.2 Trigger sensitivity
145	17.3 Trigger minimum rate of change
146	17.4 Trigger coupling to signal
147	Annex A (informative) Sine fitting algorithms A.1 Algorithm for three-parameter (known frequency) least squares fit to sine wave data using matrix operations
148	A.2 Algorithm for four-parameter (general use) least squares fit to sine wave data using matrix operations
151	Annex B (informative) Phase noise B.1 What is phase noise?
153	B.2 Phase noise measurements B.3 Phase noise effect on test results
157	B.4 Phase noise effects on specific tests
160	Annex C (informative) Comment on errors associated with word-error-rate measurement
162	Annex D (informative) Measurement of random noise below the quantization level D.1 1 Derivation of equations
165	Annex E (informative) Software consideration E.1 Motivation E.2 Test of software to fit waveforms E.3 Test of DFT software E.4 Software toolkit
166	Annex F (informative) Excitation with precision source with ramp verneir: determination of the test parameters F.1 General F.2 Triangular wave amplitude (A)
167	F.3 DC source output voltages (Vj)
168	F.4 Number of samples (K and M) and triangular wave frequency (f)
169	Annex G (informative) Presentation of sine wave data G.1 General G.2 ENOB presentation
170	G.3 Presentation of residuals
172	G.4 Other examples of presentations of sine wave test results
178	Annex H (informative) Bibliography
181	Back cover