IEEE 1671.4 2008
$44.96
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
| Published By | Publication Date | Number of Pages |
| IEEE | 2008 | 34 |
New IEEE Standard – Active. This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1671.4-2007 Front Cover |
| 3 | Title Page |
| 6 | Introduction Notice to users Laws and regulations |
| 7 | Copyrights Updating of IEEE documents Errata Interpretations Patents |
| 8 | Participants |
| 10 | Contents |
| 11 | Important Notice 1. Overview |
| 12 | 1.1 Scope 1.2 Purpose 1.3 Application 1.4 Conventions used within this document |
| 13 | 2. Normative references |
| 14 | 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 15 | 3.2 Acronyms and abbreviations |
| 16 | 4. Schema—TestConfiguration.xsd 4.1 General 4.2 Elements |
| 18 | 4.3 Child elements |
| 24 | 4.4 Complex types |
| 26 | 4.5 Inherited simple types 4.6 Inherited complex types |
| 27 | 4.7 Inherited attribute groups 5. Instance schema—None 6. Conformance 7. Extensibility |
| 28 | Annex A (informative) TestConfiguration instance documents (.XML files) |
| 29 | Annex B (informative) Users information and examples |
| 31 | Annex C (informative) Glossary |
| 32 | Annex D (informative) Bibliography |
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