IEEE IEC 62860 2013

$89.38

IEC/IEEE Test methods for the characterization of organic transistors and materials

Published By	Publication Date	Number of Pages
IEEE	2013	28

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Description

Adoption Standard – Active. Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1620 (IEC 62860) Front Cover
4	CONTENTS
5	Foreword
7	Title page
9	IEEE Introduction Notice to users Laws and regulations Copyrights
10	Updating of IEEE documents Errata Patents
11	Important Notice 1. Overview 1.1 Scope 1.2 Purpose
12	1.3 Electrical characterization overview
13	2. Definitions, acronyms, and abbreviations 2.1 Definitions
16	2.2 Acronyms and abbreviations 3. Standard OFET characterization procedures 3.1 Device structures
17	3.2 Guidelines for the OFET characterization process
18	3.3 Electrical standards
21	3.4 Reporting data
23	3.5 Environmental control and standards
24	Annex A (informative) Bibliography
25	Annex B (informative) IEEE List of Participants