TIA-455-198:2002 (R2012)

$26.00

FOTP-198 Measurement of Polarization Dependence of Insertion Loss of Single-Mode Fiberoptic Components by a Mueller Matrix Method

Published By	Publication Date	Number of Pages
TIA	2002	26

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Description

This procedure can be applied to any single-mode passive
component, including connectors, splices, couplers, attenuators,
isolators, switches, multiplexers and demultiplexers, optical
amplifiers (non-operating), circulators and filters. It is used to
measure the total range of insertion loss as PDL due to changes in
polarization of the launch state. For branching devices, it can
also be used to measure the total range of coupling ratio. It
cannot be used to measure polarization-maintaining components or to
measure the polarization dependence of return loss nor is this
method applicable to measuring the polarization dependence of
higher order attributes such as center wavelength and bandwidth of
filters.. This procedure could be used to measure the polarization
dependence of non-diagonal transmission coefficients, e.g.
wavelength isolation and directivity.

This method differs from that described in FOTP-157, which is
based on manipulation of the state of polarization of light either
continuously or in small increments in order to measure maxima and
minima of the attenuation of transmitted light. This method
involves the measurement of the behavior of Specimen when
illuminated by a small set of well-defined states of polarization
of input light. These measurements are followed by a matrix
calculation to determine the polarization dependent loss (PDL) of
the Specimen. It may be considered an efficient alternative to
FOTP-157 when a result is required from a small, discrete number of
measurements, such as in automated testing.

Generally, PDL techniques based on matrix methods fall into two
categories, i.e. those based on Mueller calculus (hereafter
referred to as Mueller/Stokes methods) and those based on the Jones
calculus. While the two techniques are mathematically equivalent
for completely polarized light, only the Mueller/Stokes method is
applicable in the case of partially polarized light and is
therefore to be considered to be more general. In addition, methods
based on the Jones matrix generally require known polarization
states on both input and output while the Mueller/Stokes methods
require only known input states. Precise prior characterization of
the input states is required in either case.