{"id":233300,"date":"2024-10-19T15:12:18","date_gmt":"2024-10-19T15:12:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-60749-72011\/"},"modified":"2024-10-25T09:41:31","modified_gmt":"2024-10-25T09:41:31","slug":"bs-en-60749-72011","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-60749-72011\/","title":{"rendered":"BS EN 60749-7:2011"},"content":{"rendered":"
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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5<\/td>\n | English \n CONTENTS <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 4 Test apparatus 4.1 Mass spectrometer method 4.2 Mass spectrometer <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.3 Vacuum opening chamber 4.4 Piercing arrangement 4.5 Pressure-sensing device <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5 Procedure <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6 Failure criteria 7 Implementation <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 8 Summary <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Semiconductor devices. Mechanical and climatic test methods – Internal moisture content measurement and the analysis of other residual gases<\/b><\/p>\n |