{"id":422500,"date":"2024-10-20T06:41:31","date_gmt":"2024-10-20T06:41:31","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62899-503-32021-2\/"},"modified":"2024-10-26T12:32:22","modified_gmt":"2024-10-26T12:32:22","slug":"bs-iec-62899-503-32021-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62899-503-32021-2\/","title":{"rendered":"BS IEC 62899-503-3:2021"},"content":{"rendered":"

This part of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L<\/i>) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
4<\/td>\nCONTENTS <\/td>\n<\/tr>\n
5<\/td>\nFOREWORD <\/td>\n<\/tr>\n
7<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
8<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
9<\/td>\n4 Symbols and abbreviated terms
Figures
Figure 1 \u2013 Schematic structure of printed thin film transistors (TFTs) <\/td>\n<\/tr>\n
10<\/td>\n5 Measuring method of contact resistance
5.1 General
5.2 Preparation of TEGs
Figure 2 \u2013 Measurement configuration <\/td>\n<\/tr>\n
11<\/td>\n5.3 Measuring apparatus
5.4 Environmental conditions and storage
5.5 Measuring procedure <\/td>\n<\/tr>\n
12<\/td>\n5.6 Data analysis
5.6.1 Calculation procedure of normalized resistances for each TEG
5.6.2 Derivation procedure of contact resistance (Rc)
Figure 3 \u2013 Example of plots of the total resistance R versus the distancebetween the source and drain electrode (channel length) L <\/td>\n<\/tr>\n
13<\/td>\n5.7 Report <\/td>\n<\/tr>\n
14<\/td>\nAnnex A (informative)Examples of sets of source and drain electrodes layouts in a TEG
Figure A.1 \u2013 Example of a set of source and drain electrodes in a TEG <\/td>\n<\/tr>\n
15<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Printed electronics – Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2021<\/td>\n16<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":422508,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[576,2641],"product_tag":[],"class_list":{"0":"post-422500","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-30","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/422500","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/422508"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=422500"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=422500"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=422500"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}