{"id":436320,"date":"2024-10-20T07:53:58","date_gmt":"2024-10-20T07:53:58","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-2671-2022\/"},"modified":"2024-10-26T14:55:06","modified_gmt":"2024-10-26T14:55:06","slug":"ieee-2671-2022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-2671-2022\/","title":{"rendered":"IEEE 2671-2022"},"content":{"rendered":"

New IEEE Standard – Active.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 2671-2022 Front cover <\/td>\n<\/tr>\n
2<\/td>\nTitle page <\/td>\n<\/tr>\n
4<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
10<\/td>\nIntroduction <\/td>\n<\/tr>\n
11<\/td>\nContents <\/td>\n<\/tr>\n
13<\/td>\nList of Figures <\/td>\n<\/tr>\n
15<\/td>\nList of Tables <\/td>\n<\/tr>\n
16<\/td>\n1.\u2002Overview
1.1\u2002Scope
1.2\u2002Purpose
1.3\u2002Word usage <\/td>\n<\/tr>\n
17<\/td>\n2.\u2002Normative references
3.\u2002Definitions, acronyms, and abbreviations
3.1\u2002Definitions
3.2\u2002Acronyms and abbreviations <\/td>\n<\/tr>\n
18<\/td>\n4.\u2002Generic flows and architecture
4.1\u2002Generic flows and generic architecture <\/td>\n<\/tr>\n
20<\/td>\n4.2\u2002Scenario and defect modes
5.\u2002Input
5.1\u2002Requirements for image acquisition <\/td>\n<\/tr>\n
21<\/td>\n5.2\u2002Setup <\/td>\n<\/tr>\n
22<\/td>\n5.3\u2002Lighting
5.4\u2002Camera
5.5\u2002Other features <\/td>\n<\/tr>\n
23<\/td>\n6.\u2002Process
6.1\u2002Requirements of vision-based processing <\/td>\n<\/tr>\n
24<\/td>\n6.2\u2002Features
7.\u2002Output
7.1\u2002Output requirements <\/td>\n<\/tr>\n
25<\/td>\n7.2\u2002Output data, output file, and output form
7.3\u2002System interface standards
7.4\u2002Output storage methods
8.\u2002Function requirements
8.1\u2002General <\/td>\n<\/tr>\n
26<\/td>\n8.2\u2002Operation mode switching function <\/td>\n<\/tr>\n
27<\/td>\n8.3\u2002Configuration management function
8.4\u2002Self-diagnostic function
8.5\u2002Remote system maintenance function
8.6\u2002Report function
8.7\u2002Control function <\/td>\n<\/tr>\n
28<\/td>\n8.8\u2002Security and safety function
8.9\u2002System reset function
9.\u2002Interoperability Requirements
9.1\u2002Scenario <\/td>\n<\/tr>\n
29<\/td>\n9.2\u2002Interoperability requirement
9.3\u2002Communication protocol <\/td>\n<\/tr>\n
30<\/td>\n9.4\u2002Communication interface
9.5\u2002Data access
9.6\u2002System management function <\/td>\n<\/tr>\n
32<\/td>\n10.\u2002Performance
10.1\u2002Comprehensive performance <\/td>\n<\/tr>\n
33<\/td>\n10.2\u2002 Equipment performance
10.3\u2002 Process performance <\/td>\n<\/tr>\n
34<\/td>\n10.4\u2002Manufacturing management performance
11.\u2002Test methodology
11.1\u2002General <\/td>\n<\/tr>\n
35<\/td>\n11.2\u2002Industrial scene survey
11.3\u2002Demand to sort out
11.4\u2002Testing preparation
11.5\u2002Select the test case
11.6\u2002Select industry comparison samples
11.7\u2002Test suite simulation <\/td>\n<\/tr>\n
36<\/td>\n11.8\u2002Output test results <\/td>\n<\/tr>\n
37<\/td>\nAnnex\u00a0A (informative) Integrated circuit (IC) substrate inspection
A.1\u2002Overview <\/td>\n<\/tr>\n
38<\/td>\nA.2\u2002Detailed introduction <\/td>\n<\/tr>\n
42<\/td>\nA.3\u2002Analysis <\/td>\n<\/tr>\n
43<\/td>\nAnnex\u00a0B (normative) Thermal grease online detection
B.1\u2002Overview <\/td>\n<\/tr>\n
44<\/td>\nB.2\u2002Detailed introduction <\/td>\n<\/tr>\n
47<\/td>\nB.3\u2002Analysis <\/td>\n<\/tr>\n
48<\/td>\nAnnex C (informative) Machine vision in process control of IC manufacturing
C.1\u2002Overview <\/td>\n<\/tr>\n
49<\/td>\nC.2\u2002Detailed introduction <\/td>\n<\/tr>\n
52<\/td>\nC.3\u2002Analysis <\/td>\n<\/tr>\n
53<\/td>\nAnnex\u00a0D (informative) Online detection on semiconductor package
D.1\u2002Overview <\/td>\n<\/tr>\n
54<\/td>\nD.2\u2002Detailed introduction <\/td>\n<\/tr>\n
59<\/td>\nD.3\u2002Analysis <\/td>\n<\/tr>\n
60<\/td>\nAnnex\u00a0E (informative) Defect detection of magnetic tiles based on machine vision
E.1\u2002Overview <\/td>\n<\/tr>\n
62<\/td>\nE.2\u2002Detailed introduction <\/td>\n<\/tr>\n
64<\/td>\nE.3\u2002Analysis <\/td>\n<\/tr>\n
65<\/td>\nBack cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for General Requirements of Online Detection Based on Machine Vision in Intelligent Manufacturing (Approved Draft)<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2022<\/td>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":436329,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-436320","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/436320","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/436329"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=436320"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=436320"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=436320"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}