IEC 60749-10:2002
$6.50
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Parité 10 : chocs mécaniques
| Published By | Publication Date | Number of Pages |
| IEC | 2002-04-09 | 16 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2002-04-09 |
| Pages Count | 16 |
| Language | France |
| Edition | 1.0 |
| File Size | 399.4 KB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
Related products
-
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods – Sealing Published By Publication Date Number of…
-
BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods – Mechanical shock. device and subassembly Published By…
-
BS EN 60749-31:2003
Semiconductor devices. Mechanical and climatic test methods – Flammability of plastic-encapsulated devices (internally induced) Published…
-
BS EN 60749:1999:2002 Edition
Semiconductor devices. Mechanical and climatic test methods Published By Publication Date Number of Pages BSI…
-
UNE-EN IEC 60794-6-10:2020:2021 Edition
Optical fibre cables – Part 6-10: Indoor-outdoor cables – Family specification for universal indoor-outdoor cables…
-
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods – External visual examination Published By Publication Date…
-
IEC 60794-6-10:2020
Optical fibre cables – Part 6-10: Indoor-outdoor cables – Family specification for universal indoor-outdoor cables…
-
BS EN 60749-10:2002
Semiconductor devices. Mechanical and climatic test methods – Mechanical shock Published By Publication Date Number…
-
BS EN 60749-32:2003+A1:2010:2011 Edition
Semiconductor devices. Mechanical and climatic test methods – Flammability of plastic-encapsulated devices (externally induced) Published…
-
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods – External visual examination Published By Publication Date…
-
IEC 60749-10:2022
Semiconductor devices – Mechanical and climatic test methods – Part 10: Mechanical shock – device…
-
IEC 60794-3-10:2009
Optical fibre cables – Part 3-10: Outdoor cables – Family specification for duct, directly buried…
-
BS EN 60749-32:2003+A1:2010:2011 Edition
Semiconductor devices. Mechanical and climatic test methods – Flammability of plastic-encapsulated devices (externally induced) Published…
-
BS EN 60749-12:2002
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
-
BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
-
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress…
-
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods – Storage at high temperature Published By Publication…
-
BS EN 60749-9:2002
Semiconductor devices. Mechanical and climatic test methods – Permanence of marking Published By Publication Date…
-
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods – Storage at high temperature Published By Publication…
-
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
-
BS EN 60749-22:2003
Semiconductor devices. Mechanical and climatic test methods – Bond strength Published By Publication Date Number…
-
IEC 60794-4-10:2006
Câbles à fibres optiques – Partie 4-10: Câbles optiques aériens le long des lignes électriques…
-
BS EN 60749-18:2003:2004 Edition
Semiconductor devices. Mechanical and climatic test methods – Ionizing radiation (total dose) Published By Publication…
-
BS EN IEC 60749-10:2022 – TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Mechanical shock. device and subassembly…
-
BSI 20/30413501 DC:2020 Edition
BS EN IEC 60794-1-402. Optical Fibre Cables. Basic optical cable test procedures – Part 402.…
-
BS EN 60749-11:2002:2003 Edition
Semiconductor devices. Mechanical and climatic test methods – Rapid change of temperature. Two-fluid-bath method Published…
-
BS EN 60749-13:2002
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
-
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods – General Published By Publication Date Number of…
-
BS EN 60749-3:2002
Semiconductor devices. Mechanical and climatic test methods – External visual examination Published By Publication Date…
-
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
-
IEC 60747-16-10:2004
Dispositifs à semiconducteurs – Partie 16-10: Format-cadre pour agrément de technologie (TAS) pour circuits intégrés…
-
BS EN IEC 60794-6-10:2020
Optical fibre cables – Indoor-outdoor cables. Family specification for universal indoor-outdoor cables Published By Publication…
-
BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods – Permanence of marking Published By Publication Date…
-
BSI 22/30466118 DC:2022 Edition
BS EN IEC 60794-1-218. Optical fibre cables – Part 1-218. Generic specification. Basic optical cable…
-
BS EN 60749-20:2009 2010
Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic encapsulated SMDs to the…
-
BS EN 60749-7:2002
Semiconductor devices. Mechanical and climatic test methods – Internal moisture content measurement and the analysis…
-
BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
-
BS EN 60749-4:2002
Semiconductor devices. Mechanical and climatic test methods – Damp heat, steady state, highly accelerated stress…
-
BS EN 60749-6:2002
Semiconductor devices. Mechanical and climatic test methods – Storage at high temperature Published By Publication…
-
BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods – Low air pressure Published By Publication Date…
