IEC 60749-40:2011
$43.55
Dispositifs à semiconducteurs – Méthodes d’essais climatique et mécaniques – Partie 40 : méthode d’essai de chute au niveau de la carte avec utilisation d’une jauge de contrainte
| Published By | Publication Date | Number of Pages |
| IEC | 2011-07-13 | 48 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2011-07-13 |
| Pages Count | 48 |
| Language | France |
| Edition | 1.0 |
| File Size | 1.5 MB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
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