{"id":234272,"date":"2024-10-19T15:16:44","date_gmt":"2024-10-19T15:16:44","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-60749-172019-tc\/"},"modified":"2024-10-25T09:49:12","modified_gmt":"2024-10-25T09:49:12","slug":"bs-en-iec-60749-172019-tc","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-60749-172019-tc\/","title":{"rendered":"BS EN IEC 60749-17:2019 – TC"},"content":{"rendered":"

IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition: <\/p>\n

    \n
  1. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;<\/li>\n
  2. addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.<\/li>\n<\/ol>\n

    PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n
    PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
    16<\/td>\nundefined <\/td>\n<\/tr>\n
    19<\/td>\nEnglish
    CONTENTS <\/td>\n<\/tr>\n
    20<\/td>\nFOREWORD <\/td>\n<\/tr>\n
    22<\/td>\n1 Scope
    2 Normative references
    3 Terms and definitions
    4 Test apparatus
    4.1 Test instruments
    4.2 Radiation source <\/td>\n<\/tr>\n
    23<\/td>\n4.3 Dosimetry equipment
    4.4 Dosimetry measurements
    4.4.1 Neutron fluences
    4.4.2 Dose measurements
    5 Procedure
    5.1 Safety requirements
    5.2 Test samples <\/td>\n<\/tr>\n
    24<\/td>\n5.3 Pre-exposure
    5.3.1 Electrical tests
    5.3.2 Exposure set-up
    5.4 Exposure
    5.5 Post-exposure
    5.5.1 Electrical tests
    5.5.2 Anomaly investigation
    5.6 Reporting <\/td>\n<\/tr>\n
    25<\/td>\n6 Summary <\/td>\n<\/tr>\n
    26<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

    Tracked Changes. Semiconductor devices. Mechanical and climatic test methods – Neutron irradiation<\/b><\/p>\n\n\n\n\n
    Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
    BSI<\/b><\/a><\/td>\n2020<\/td>\n28<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":234276,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2641],"product_tag":[],"class_list":{"0":"post-234272","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/234272","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/234276"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=234272"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=234272"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=234272"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}